Journal: Scientific Reports

Article Title: Controlling osteoblast morphology and proliferation via surface micro-topographies of implant biomaterials

doi: 10.1038/s41598-020-69685-6

Figure Lengend Snippet: Quantitative surface characterization of zirconia biomaterials. Surface topography was evaluated by interferometry. Surface parameters describing the topography of implant surfaces were ( a ) S a (average surface height deviation amplitude), ( b ) S q (root-mean-square deviation), ( c ) S z (ten-point height of surface topography), ( d ) S sk (skewness), ( e ) S ds (density of summits), ( f ) S tr (texture aspect ratio) and ( g ) S dr (surface enlargement compared to a totally flat reference area). Data show mean values of three different areas per specimen ± SEM (n = 3). Statistically significant differences (p < 0.05, Tukey’s HSD test) were marked with “a” if a Ce-TZP surface differed statistically significant from the corresponding Y-TZP surface, with “b” if Y-TZP + CaP, Y-TZPgr or Y-TZPsa differed from Y-TZP or if Ce-TZP + CaP, Ce-TZPgr or Ce-TZPsa differed from Ce-TZP, with “c” if Y-TZPgr or Y-TZPsa differed from Y-TZP + CaP or if Ce-TZPgr or Ce-TZPsa differed from Ce-TZP + CaP and with “d” if Y-TZPsa differed from Y-TZPgr or if Ce-TZPsa differed from Ce-TZPgr.

Article Snippet: Surface topography of the implant materials was examined as already described in a previous report by scanning electron microscopy (SEM, LEO435VP scanning electron microscope, Zeiss, Oberkochen, Germany) with the backscattered electron imaging mode and an accelerated voltage of 8.00–12.00 kV after sputter coating with gold–palladium for 60 s at 60 mA (SCD050; Balzers, Liechtenstein), and by light interferometry (IFM, MicroXAM 100 h; ADE; Phase Shift Technology, Tucson, USA).

Techniques: